JPS5917870U - フラット型半導体パッケージ試験用基板 - Google Patents

フラット型半導体パッケージ試験用基板

Info

Publication number
JPS5917870U
JPS5917870U JP11248182U JP11248182U JPS5917870U JP S5917870 U JPS5917870 U JP S5917870U JP 11248182 U JP11248182 U JP 11248182U JP 11248182 U JP11248182 U JP 11248182U JP S5917870 U JPS5917870 U JP S5917870U
Authority
JP
Japan
Prior art keywords
semiconductor package
test substrate
package test
flat semiconductor
type semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11248182U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0120701Y2 (en]
Inventor
守谷　忠司
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Risho Kogyo Co Ltd
Original Assignee
Risho Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Risho Kogyo Co Ltd filed Critical Risho Kogyo Co Ltd
Priority to JP11248182U priority Critical patent/JPS5917870U/ja
Publication of JPS5917870U publication Critical patent/JPS5917870U/ja
Priority to US06/875,517 priority patent/US4766371A/en
Application granted granted Critical
Publication of JPH0120701Y2 publication Critical patent/JPH0120701Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP11248182U 1982-07-24 1982-07-24 フラット型半導体パッケージ試験用基板 Granted JPS5917870U (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP11248182U JPS5917870U (ja) 1982-07-24 1982-07-24 フラット型半導体パッケージ試験用基板
US06/875,517 US4766371A (en) 1982-07-24 1986-06-19 Test board for semiconductor packages

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11248182U JPS5917870U (ja) 1982-07-24 1982-07-24 フラット型半導体パッケージ試験用基板

Publications (2)

Publication Number Publication Date
JPS5917870U true JPS5917870U (ja) 1984-02-03
JPH0120701Y2 JPH0120701Y2 (en]) 1989-06-21

Family

ID=30260740

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11248182U Granted JPS5917870U (ja) 1982-07-24 1982-07-24 フラット型半導体パッケージ試験用基板

Country Status (1)

Country Link
JP (1) JPS5917870U (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6156580U (en]) * 1984-09-17 1986-04-16

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53160369U (en]) * 1977-05-23 1978-12-15
JPS5467672A (en) * 1977-11-09 1979-05-31 Hitachi Ltd Jig of inspecting characteristic of electronic parts
JPS55146938A (en) * 1979-05-02 1980-11-15 Chiyou Lsi Gijutsu Kenkyu Kumiai Aging device for semiconductor element
JPS58140479U (ja) * 1982-03-16 1983-09-21 日本電気ホームエレクトロニクス株式会社 半導体装置の特性測定装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53160369U (en]) * 1977-05-23 1978-12-15
JPS5467672A (en) * 1977-11-09 1979-05-31 Hitachi Ltd Jig of inspecting characteristic of electronic parts
JPS55146938A (en) * 1979-05-02 1980-11-15 Chiyou Lsi Gijutsu Kenkyu Kumiai Aging device for semiconductor element
JPS58140479U (ja) * 1982-03-16 1983-09-21 日本電気ホームエレクトロニクス株式会社 半導体装置の特性測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6156580U (en]) * 1984-09-17 1986-04-16

Also Published As

Publication number Publication date
JPH0120701Y2 (en]) 1989-06-21

Similar Documents

Publication Publication Date Title
JPS5917870U (ja) フラット型半導体パッケージ試験用基板
JPS58182343U (ja) プリント基板装置
JPS58131638U (ja) 混成集積回路装置
JPS5920643U (ja) 半導体装置
JPS5920671U (ja) プリント配線板
JPS58118774U (ja) 電子回路パツケ−ジ
JPS6081674U (ja) セラミツク混成集積回路装置
JPS5952485U (ja) 半導体試験用基板
JPS58133940U (ja) 電子機器の放熱装置
JPS5872869U (ja) 電子回路装置
JPS61284U (ja) 小型電子機器の構造
JPS6045494U (ja) 混成集積回路装置
JPS5978707U (ja) 小形携帯無線機用アンテナ
JPS5965563U (ja) プリント配線基板
JPS5956770U (ja) 印刷回路配線板
JPS5956751U (ja) 電源バス
JPS5964249U (ja) サ−マルヘツド
JPS58129666U (ja) プリント基板装置
JPS5840868U (ja) プリント配線基板
JPS59121856U (ja) プリント基板
JPS5970354U (ja) 半導体装置の外部リ−ド取付用治具
JPS5999477U (ja) 混成集積回路装置
JPS5918459U (ja) 電気素子取付構造
JPS58175668U (ja) 印刷配線板
JPS59123387U (ja) 発熱部品の取付装置